Please use this identifier to cite or link to this item: http://ena.lp.edu.ua:8080/handle/ntb/55958
Title: Nanopositioning and nanomeasuring machine for multi-sensor applications
Authors: Manske, Eberhard
Jäger, Gerd
Mastylo, Rostyslav
Dontsov, Denis
Affiliation: Technische Universität Ilmenau
SIOS Meßtechnik GmbH
Bibliographic description (Ukraine): Nanopositioning and nanomeasuring machine for multi-sensor applications / Eberhard Manske, Gerd Jäger, Rostyslav Mastylo, Denis Dontsov // Measuring Equipment and Metrology. — Lviv : Lviv Politechnic Publishing House, 2020. — Vol 81. — No 2. — P. 17–24.
Bibliographic description (International): Nanopositioning and nanomeasuring machine for multi-sensor applications / Eberhard Manske, Gerd Jäger, Rostyslav Mastylo, Denis Dontsov // Measuring Equipment and Metrology. — Lviv : Lviv Politechnic Publishing House, 2020. — Vol 81. — No 2. — P. 17–24.
Is part of: Вимірювальна техніка та метрологія, 2 (81), 2020
Measuring Equipment and Metrology, 2 (81), 2020
Journal/Collection: Вимірювальна техніка та метрологія
Issue: 2
Issue Date: 24-Feb-2020
Publisher: Видавництво Львівської політехніки
Lviv Politechnic Publishing House
Place of the edition/event: Львів
Lviv
DOI: doi.org/10.23939/istcmtm2020.02.017
Keywords: Nanopositioning and Nanomeasuring Machine
multi-sensor technology
Probe
Nanotechnology
Number of pages: 8
Page range: 17-24
Start page: 17
End page: 24
Abstract: In micro- and nanotechnology, the demands placed on measurement technology are increasing. The structures to be measured are becoming more complex with smaller structure widths, increasingly larger surface regions, and thousands of inspection features. To solve the problems, it has become desirable and even necessary to combine multi-sensor technology with high precision nanopositioning and nanomeasuring technology. The Nanopositioning and Nanomeasuring Machine NMM-1 with a measuring range of 25 mm × 25 mm × 5 mm and sub-nanometer resolution allow the application of several optical, tactile and atomic force probes. The combination of several sensor technologies in a multi-sensor approach for application with the NMM-1 is demonstrated.
URI: http://ena.lp.edu.ua:8080/handle/ntb/55958
Copyright owner: © Національний університет “Львівська політехніка”, 2020
URL for reference material: http://www.itrs.net/Links
References (Ukraine): [1] International Technology Roadmap for Semiconductors, 2009. [Online] Available: http://www.itrs.net/Links /2009ITRS /2009Chapters_2009Tables/2009_Metrology.pdf)
[2] G. Jäger, E. Manske, T. Hausotte, H.-J. Büchner, “The metrological basis and operation of nanopositioning and nanomeasuring machine NMM-1”, Tech. Mess., Vol. 76, No. 5, 2009, pp. 227–234.
[3] E. Manske, T. Hausotte, R. Mastylo, T. Machleidt, K.-H. Franke and G. Jäger, “New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes”, Meas. Sci. Technol., Vol. 18, No. 2, 2007, pp. 520–527.
[4] T. Machleidt, E. S., D. Kapusi, and K.a-H. Franke, “Depth From Focus (DFF) Utilizing the Large Measuring Volume of a Nanopositioning and Nanomeasuring Machine”, Proc. Sensoren und Messsysteme, Nürnberg, Germany, pp. 478–481, May 2010.
[5] T. Machleidt, E. Sparrer, N. Dorozhovets, E. Manske, K.-H. Franke, and D. Kapusi, “Navigation in a Large Measurement Volume by Using AFM Technology as a Sensor System in the NPMM”, Tech. Mess., Vol. 76, No. 5, 2009, pp. 274–277.
[6] S. Buetefisch, G. Dai, H.-U. Danzebrink, L. Koenders, F. Solzbacher, and M.P. Orthner, “Novel design for an ultra high precision 3D micro probe for CMM applications”, Proc. Eurosensors XXIV, September 5–8, 2010, Linz, Austria, Vol. 5, 2010, pp. 705–712.
[7] M. Ritter, T. Dziomba, A. Kranzmann, and L. Koenders, “A landmark-based 3D calibration strategy for SPM”, Meas. Sience Techn., Vol. 18, 2007, pp. 404–414.
[8] E.Manske, G. Jäger, T. Hausotte, and T. Machleidt, “Multisensor technology based on a laser focus probe for nanomeasuring applications over large areas”, In Proc. of the SPIE – The Internat. Soc. for Opt. Eng., Vol. 8082, 2011, pp.: 808203 (9 pp.).
References (International): [1] International Technology Roadmap for Semiconductors, 2009. [Online] Available: http://www.itrs.net/Links /2009ITRS /2009Chapters_2009Tables/2009_Metrology.pdf)
[2] G. Jäger, E. Manske, T. Hausotte, H.-J. Büchner, "The metrological basis and operation of nanopositioning and nanomeasuring machine NMM-1", Tech. Mess., Vol. 76, No. 5, 2009, pp. 227–234.
[3] E. Manske, T. Hausotte, R. Mastylo, T. Machleidt, K.-H. Franke and G. Jäger, "New applications of the nanopositioning and nanomeasuring machine by using advanced tactile and non-tactile probes", Meas. Sci. Technol., Vol. 18, No. 2, 2007, pp. 520–527.
[4] T. Machleidt, E. S., D. Kapusi, and K.a-H. Franke, "Depth From Focus (DFF) Utilizing the Large Measuring Volume of a Nanopositioning and Nanomeasuring Machine", Proc. Sensoren und Messsysteme, Nürnberg, Germany, pp. 478–481, May 2010.
[5] T. Machleidt, E. Sparrer, N. Dorozhovets, E. Manske, K.-H. Franke, and D. Kapusi, "Navigation in a Large Measurement Volume by Using AFM Technology as a Sensor System in the NPMM", Tech. Mess., Vol. 76, No. 5, 2009, pp. 274–277.
[6] S. Buetefisch, G. Dai, H.-U. Danzebrink, L. Koenders, F. Solzbacher, and M.P. Orthner, "Novel design for an ultra high precision 3D micro probe for CMM applications", Proc. Eurosensors XXIV, September 5–8, 2010, Linz, Austria, Vol. 5, 2010, pp. 705–712.
[7] M. Ritter, T. Dziomba, A. Kranzmann, and L. Koenders, "A landmark-based 3D calibration strategy for SPM", Meas. Sience Techn., Vol. 18, 2007, pp. 404–414.
[8] E.Manske, G. Jäger, T. Hausotte, and T. Machleidt, "Multisensor technology based on a laser focus probe for nanomeasuring applications over large areas", In Proc. of the SPIE – The Internat. Soc. for Opt. Eng., Vol. 8082, 2011, pp., 808203 (9 pp.).
Content type: Article
Appears in Collections:Вимірювальна техніка та метрологія. – 2020. – Випуск 81, №2



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